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VLSI Design and Test

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VLSI Design and Test — 22nd International Symposium, VDAT 2018, Madurai, India, June 28-30, 2018, Revised Selected Papers. An English-language digital edition by S. Rajaram (Editor); N.B. Balamurugan (Editor); D. Gracia Nirmala Rani (Editor); Virendra Singh (Editor), available in PDF.

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About this book

VLSI Design and Test — 22nd International Symposium, VDAT 2018, Madurai, India, June 28-30, 2018, Revised Selected Papers. An English-language digital edition by S. Rajaram (Editor); N.B. Balamurugan (Editor); D. Gracia Nirmala Rani (Editor); Virendra Singh (Editor), available in PDF.

Edition details

  • Author / contributors: S. Rajaram (Editor); N.B. Balamurugan (Editor); D. Gracia Nirmala Rani (Editor); Virendra Singh (Editor)
  • Publisher: Springer Nature Singapore
  • Publication date: January 24, 2019
  • Language: English
  • ISBNs: 9789811359491; 9789811359507
  • Digital formats: PDF

Additional information

Author

S. Rajaram (Editor); N.B. Balamurugan (Editor); D. Gracia Nirmala Rani (Editor); Virendra Singh (Editor)

Publisher

Springer Nature Singapore

Language

English

ISBN

9789811359491, 9789811359507

Format

PDF

Publication date

January 24, 2019

DRM

DRM-free edition available

Download format PDF (.pdf)

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